We
also recognize that, you, our customers - being as
diverse as you are - expect in-circuit test
equipment to be flexible in addressing your
additional value-added requirements.
We weren't sure who would need which
features, so we included the following options to
ensure you could customize our in-circuit testers to
shrink your manufacturing processes and reap the
maximum value for your investment.
- Bode Scan
- Power-up Test
- Boundary Scan JTAG) Test
- Advanced Function Test
- Flash Device Programming
- In-System Device Programming
We are also quite sure that none
of our customers want to pay for features they won't
use. That is why the most flexible, feature-rich
in-circuit test platform on the market comes with
the most affordable price tags to fit your
requirements and budget.
Key Features:
- Rapid realization of test
programs
- Comprehensive set of ICT test
options
- Graphical program debug tools
- Reliable measurement
electronics
- Boundary Scan (JTAG) support
- In-circuit programming
support
- Fast test times
- Functional testing
- Graphical CAD-to-Tester
processing solution
- Power-up testing
- Expandable to meet your
future needs
- SMEMA compatibility
HIGH PERFORMANCE ANALOG
MEASUREMENT SYSTEM
The Scorpion family of test
equipment all feature an analog measurement system
consisting of a Measure and Stimulus instrument
(M&S) with flexible bi-directional routing between
instruments and receiver pins. Under program
control, each of the analog measurement and stimulus
instruments are set up and routed to their assigned
pins for each test performed. The non-multiplexed
architecture of Scorpion ICT series improves test
performance and simplifies fixture design and test
generation.
The M&S module provides stimulus
and measurement facilities for detecting shorts,
opens, and incorrect component values on the Unit
Under Test (UUT). In-circuit measurement of
resistance, capacitance, and inductance identify
actual component values. Analog functional testing
can also verify power on component parameters such
as transistor beta, op amp closed loop gain, diode
characteristics, and transfer characteristics.
Patented Vectorless Test
Vectorless test was pioneered in
1990 by ITA/Scorpion, (part of the Acculogic Group).
In the last few years, it has become the preferred
method to find �opens� faults around large pin count
digital devices. This test method has rendered the
lengthy process of test pattern development required
to inspect complex VLSI parts on traditional
In-Circuit testers obsolete. Acculogic's Open Pin
detection consists of two complimentary tools for
the Scorpion iCT7000-series of testers; CScan� and
ChipScan�.
- CScan� Detects open leads on
ICs including BGAs, reverse electrolytic
capacitors, connector pins, and decoupling
capacitors
- ChipScan� Detects open leads
on ICs including BGAs with heat sinks
BodeScan
BodeScan is a patented, built-in
network analyzer for detecting missing or incorrect
small value components in complex RF networks
ADVANCED FUNCTION TESTING
Advanced Function Test expands the
capabilities of the Scorpion ICT beyond basic
manufacturing process test. External commercially
available instruments integrate directly with the
Scorpion iCT and signal lines are routed to the
fixture receiver under software control. Each
instrument's graphical user interface (GUI) provides
an intuitive representation of the instrument
controls and functions. Configuring instruments for
a measurement is as simple as setting the dials.
Once the parameters for a particular measurement are
configured, program steps within the Integrator
software environment flow seamlessly. Instrument
drivers are based on Interchangeable Virtual
Instrument (IVI) protocols thus allowing easy and
fast instrument replacement.
Acculogic Integrator� Software
Integrator� software is the
comprehensive, easy-to-use graphical test generation
and runtime environment for all Scorpion In-Circuit
and Flying Probe Test Systems. This software offers
Acculogic customers a highly effective user-friendly
environment for producing and executing test
programs.
Automatic or interactive program
generation
Integrator� software accepts CAD
data from a variety of board design and layout
sources. Integrator uses the CAD data, Bill of
Materials (BoM), and netlist to create a high fault
coverage test program and generate the complete
fixture design and fabrication information. A highly
automated process, most elements of the test program
can be automatically generated in minutes.
Wide Test Coverage at Impressive
Speeds
Evolving test requirements are met
through modular expansion of the system with a broad
array of innovative, patented test features: CScan,
ChipScan, BodeScan or Memory Programming Module (MPM).
The result is extremely fast and extensive testing
that minimizes false fails.
System versatility
The logical subdivision of the
systems into control computer, power supply and
measurement/switching unit guarantees ease of
integration into any test environment. Its
modularity based on the 19�standard rack allows
cost-effective incorporation into any production
environment. |